Differential scanning calorimetry is a powerful thermal analytical technique that can be used to analyze thermal properties of a material system. DSC measures the difference in the amount of energy required to heat a sample and a reference at the same rate.


Ebatco’s JEOL 6610LV SEM is equipped with a Bruker XFlash 6|30 Energy Dispersive X-Ray Spectrometer (EDS) system, which expands the capabilities of the SEM to rapid qualitative and quantitative element identification and chemical analysis.

Refractive Index

Refractive index measurements are primarily used to quantitatively compare different samples. It is affected by parameters that are not so easily measured in other ways, such as concentration and purity.


The JEOL 6610LV can produce high resolution images under either secondary electron mode or a backscattered electron mode for surface topography and composition analysis. The SEM is expected to further expand NAT Lab’s portfolio offerings in surface morphology, metallurgy, particle sizing, surface roughness and micro/nano dimensional measurement areas.


STA stands for simultaneous thermal analysis of DSC and TGA. It combines the DSC and TGA measurements into a single process, both saving time and simplifying interpretation of the results.


Thermogravimetric analysis involves measuring a sample’s change in mass as it is heated and is a very useful technique for analyzing samples that either gain or lose mass during heating. It can be used to study decomposition, reaction equlibrium, pyrolysis, oxidation, filler mass, ash percent, metallic residue, and loss of solvents/water/plasticizer during heating or aging.