EDS

Ebatco’s JEOL 6610LV SEM is equipped with a Bruker XFlash 6|30 Energy Dispersive X-Ray Spectrometer (EDS) system, which expands the capabilities of the SEM to rapid qualitative and quantitative element identification and chemical analysis.

Failure Analysis

Failure analysis is of utmost importance in many industrial applications. Knowing how and why a material failed is essential to ensuring a product’s reliability, to identifying the root cause of failure and to implementing ways to alleviating and/or preventing parts from failure, and to paving the way of improving performance of materials and designs.

Metallography

Metallography studies identify metallurgical characteristics of materials. Metallography is also one of the primary tools to analyse metal failure mechanisms.

Microhardness

Vickers and Micro Vickers hardness measurements through microindentation tests.

Nanohardness

Nano hardness, elastic modulus, stiffness measurements through nanoindentation tests.

Sample Preparation

Depending on the analysis that is to be performed, sample preparation refers to the ways in which a sample is treated prior to its analysis. Preparation is a very important step in most analytical techniques in order to gain meaningful analytical results by preserving the nature of the analyte while enabling the analysis.

SEM

The JEOL 6610LV can produce high resolution images under either secondary electron mode or a backscattered electron mode for surface topography and composition analysis. The SEM is expected to further expand NAT Lab’s portfolio offerings in surface morphology, metallurgy, particle sizing, surface roughness and micro/nano dimensional measurement areas.

SPM

The Hysitron TriboIndenter, which can perform nanoindentation and nanoscratch testing, has the capability to perform in-situ scanning probe microscopy (SPM).