Optical microscopy can be accomplished through various instruments equipped in the NAT Lab. The Zeiss Axioscope, AmScope Stereo Microscope, TriboIndenter camera system and CSM camera system can all be perform microscopy on a wide variety of samples.
The JEOL 6610LV can produce high resolution images under either secondary electron mode or a backscattered electron mode for surface topography and composition analysis. The SEM is expected to further expand NAT Lab’s portfolio offerings in surface morphology, metallurgy, particle sizing, surface roughness and micro/nano dimensional measurement areas.
The Hysitron TriboIndenter, which can perform nanoindentation and nanoscratch testing, has the capability to perform in-situ scanning probe microscopy (SPM).