SNOM

Exponential Business and Technologies Company

Bridging You and Nano

Scanning Near-field Optical Microscope alpha300 S

Reliable and Sophisticated SNOM Imaging – Beyond the Diffraction Limit

snom

The design of the alpha300 S Scanning Near-field Optical Microscope features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument. By simply rotating the objective turret, the user can choose from among Confocal Microscopy, SNOM or AFM.

Aperture at the apex of the hollow pyramid. Aperture size 100 nm (others optional). The inset shows a side view of the Cantilever SNOM Sensor.

For scanning near-field optical microscopy, the alpha300 S uses unique and patented micro-fabricated Cantilever SNOM-sensors that significantly outperform standard fiber optic probes in resolution, transmission, ease of operation and reliability.

The cantilever, employing the well established beam deflection principle for distance control, features a hollow pyramid with an aperture at its apex. This allows for topography and optical images to be acquired simultaneously.