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SPM
The Hysitron TriboIndenter, which can perform nanoindentation and nanoscratch testing, has the capability to perform in-situ scanning probe microscopy (SPM). The TriboIndenter’s piezo scanner raster scans an probe tip across a sample surface up to 60 µm wide and at a maximum rate of 3 Hz. The setpoint applied during scanning is typically 1-2 µN. Analysis software, such as SIP or Hysitron’s TriboView, calculate surface roughness parameters from imported SPM images.
Typical Experimental Results:
SPM image of a grid pattern
3D render of a grid pattern converted from SPM image
A SPM image of a scratch on a hard drive platter and a SPM image of a rubber surface
Rubber Surface Roughness Parameters Calculated with TriboView Analysis Software
Scan Area |
400 µm^2 |
RMS (Rq) |
170.703 nm |
Average Roughness (Ra) |
137.135 nm |
Max Height |
730.156 nm |
Min Height |
-492.650 nm |
Peak-Valley |
1222.810 nm |
SPM image of a 10 µm wide wear crater
Line profile across the 10 µm wear crater generated in TriboView analysis software
Applications:
10 Peak Height |
Average Surface Roughness |
Crack Length |
Critical Dimensions |
Density of Summits |
Grip Material |
Line Profile |
Material Coating |
Material Finishing |
Material Removal |
Morphology |
Nano Features |
Peak to Peak |
Peak to Valley | RMS Roughness |
For more information please read our application notes.
Instruments: Hysitron TriboIndenter SPM
Key Specifications:
| Max Scan Area | 60 µm |
| Max Scan Rate | 3 Hz |
| Scan Lines per Image | 256 |
| Probe Tip Geometry | Berkovich, Cube Corner, Conical |
| Probe Material | Diamond |
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